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Public tenders for electrical in Ljubljana Slovenia

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DUTB, d. d. | Published November 26, 2016  -  Deadline December 27, 2016

Supply of electricity.


Univerza v Ljubljani | Published November 4, 2016  -  Deadline December 9, 2016
Supply of electricity to the Rector and State University.


DUTB, d. d. | Published November 19, 2016  -  Deadline December 27, 2016

Supply of electricity.

Construction work for electricity power lines

ELES, d.o.o. | Published November 22, 2016  -  Deadline January 30, 2017

Supply and installation of 110 kV cable system to connect the T412 to the 110 kV TR field in Divača.

Construction structures and materials; auxiliary products to construction (except electric apparatus)

Ministrstvo za obrambo | Published November 2, 2016  -  Deadline December 5, 2016
Supplies for building maintenance.

Instruments for checking physical characteristics

IJS, v angl. jeziku: JSI | Published December 10, 2016  -  Deadline January 12, 2017

Re: JN is dvožarkovni Laser Interferometer, which will be used for simultaneous measurements of electromechanical and electrical properties of thin dielectric. layers and nanostructured materials.

Subject of the contract is dvožarkovni Laser Interferometer, which will be used for simultaneous measurement of electro-mechanical and electrical properties of thin dielectric films and nanostructured materials. The beam must hit the sample with the upper and lower sides - differential mode measurement eliminate the bending basis, which is the main obstacle to the use of atomic force microscope in this type of measurement. The system must allow for (i) the simultaneous measurement of the electro-mechanical strain and the electrical polarization of a large of the excitation signal, (ii) measurement of the piezoelectric coefficient and the dielectric constant of the small of the energizing signal, even when pressed against a dc voltage, and (iii) measurement of the fatigue of electrical and electromechanical properties, the resolution at least 0.5 pm and repeatability of the maximum deviation of 0.8% from the average sigma, measured at the crystal kvarza. The system should allow the measurement of temperature dependence of all the above-mentioned amounts to at least 2.54 cm (1-inch / inch) large samples in a temperature range of at least -100 ° C to at least 300 ° C.

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