DELIVERY STATION FOR MEASURING PARAMETERS OF OPTICAL AND ELECTRICAL MATERIALS AND SEMICONDUCTOR DEVICES IN A WIDE RANGE PRECISELY CONTROLLED TEMPERATURE (DELIVERY OF VARIABLE TEMPERATURE Microprobe SYSTEM TO PROVIDE OPTICAL AND ELECTRICAL MEASURMENTS OF SEMICONDUCTOR MATERIALS AND DEVICES).
| PublishedAugust 23, 2013 - Deadline September 3, 2013
cpvs
38540000
The contract is for the supply station to the measurements of the optical and electrical materials and semiconductor devices in a wide range of precisely controlled temperature (Delivery of variable temperature system MicroProbe this popup optical and electrical measurments of semiconductor materials and devices) All parameters are described in detail in Appendix 3 hereto ..